Peças electrónicas : SNJ54BCT8244AFK

Fabricante : Texas Instruments

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Descrição : Scan Test Devices With Octal Buffers

Temperatura : Min °C | Max °C

Datasheet : SNJ54BCT8244AFK PDF

• SNJ54BCT8240AFK
• SNJ54BCT8240AJT
• SNJ54BCT8244AFK
• SNJ54BCT8244AJT
• SNJ54BCT8245AFK
• SNJ54BCT8245AJT