Peças electrónicas : SN74BCT8374ANTE4

Fabricante : Texas Instruments

Packing :

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Descrição : SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

Temperatura : Min °C | Max °C

Datasheet : SN74BCT8374ANTE4 PDF

• SN74BCT8374A
• SN74BCT8374ADW
• SN74BCT8374ADWE4
• SN74BCT8374ADWG4
• SN74BCT8374ADWR
• SN74BCT8374ADWRE4
• SN74BCT8374ADWRG4
• SN74BCT8374ANT
• SN74BCT8374ANTE4