Peças electrónicas : SN54BCT8374AFK

Fabricante : Texas Instruments

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Descrição : SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

Temperatura : Min °C | Max °C

Datasheet : SN54BCT8374AFK PDF

• SN54BCT8373A
• SN54BCT8373AFK
• SN54BCT8373AJT
• SN54BCT8374A
• SN54BCT8374AFK
• SN54BCT8374AJT
• SN54BCT8374A_08